1. Gallium Oxide Substrate β-Ga2O3 <100>
Item |
Gallium Oxide Substrate β-Ga2O3 <100> |
Diameter |
5*5mm |
10*10mm |
50.8±0.5mm |
100±0.5mm |
Thickness |
500±30μm |
Surface Orientation |
<100> ± 1.0° |
Doping |
Sn-doping |
Fe-doping |
Mg-doping |
UID |
Resistivity |
0.01~0.05 ohm.cm |
>1E10 ohm.cm |
>1E10 ohm.cm |
0.1~1 ohm.cm |
Doping Concertration |
~5E18 cm-3 |
Insulated |
Insulated |
<5E17 cm-3 |
Surface Finish |
SSP |
DSP |
Grind |
Slice |
Roughness |
<0.5nm |
<0.5nm |
<5μm |
N/A |
FWHM |
<150 arc sec |
2. Gallium Oxide Substrate β-Ga2O3 <001> <-201> <010>
Item |
Gallium Oxide Substrate β-Ga2O3 <001> <-201> <010> |
Diameter |
5*5mm |
10*10mm |
50.8±0.5mm |
Thickness |
500μm |
Surface Orientation |
<001> ± 1.0° |
<-201> ± 1.0° |
<010> ± 1.0° |
Doping |
Sn-doping |
Fe-doping |
UID |
Resistivity |
0.01~0.05 ohm.cm |
>1E10 ohm.cm |
0.1~1 ohm.cm |
Doping Concertration |
~5E18 cm-3 |
Insulated |
<5E17 cm-3 |
Surface Finish |
SSP |
DSP |
Grind |
Roughness |
<0.5nm |
<0.5nm |
<5μm |
FWHM |
<150 arc sec |
3. Sample testing data
● XRD crystal quality spectrum of n-type (001) β-Ga2O3

4. Customization specifications:* 2~4inch Ga2O3 on Ga2O3 Homoepitaxial wafer(by HVPE & MBE).
* Various sizes and shapes such as 5*5mm,10*10mm.
* Various orientations such as (001),(100),(010),(-201).
* Various types like Fe-doped,Si-doped,undoped
* Various surface roughness such as slicing,lapping,polishing.